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eeprom_stm32: implement high density wear leveling (#12567)

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* eeprom_stm32: implement wear leveling
Update EECONFIG_MAGIC_NUMBER
eeprom_stm32: check emulated eeprom size is large enough
* eeprom_stm32: Increasing simulated EEPROM density on stm32
* Adding utility script to decode emulated eeprom
* Adding unit tests
* Applying qmk cformat changes
* cleaned up flash mocking
* Fix for stm32eeprom_parser.py checking via signature with wrong base
* Fix for nk65 keyboard

Co-authored-by: Ilya Zhuravlev <whatever@xyz.is>
Co-authored-by: zvecr <git@zvecr.com>
This commit is contained in:
Donald Kjer
2021-08-23 15:15:34 -07:00
committed by GitHub
parent 2481e109a0
commit e756a21636
12 changed files with 1549 additions and 197 deletions
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7
tmk_core/common/chibios/flash_stm32.h
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@ -22,8 +22,11 @@
extern "C" {
#endif
#include <ch.h>
#include <hal.h>
#include <stdint.h>
#ifdef FLASH_STM32_MOCKED
extern uint8_t FlashBuf[MOCK_FLASH_SIZE];
#endif
typedef enum { FLASH_BUSY = 1, FLASH_ERROR_PG, FLASH_ERROR_WRP, FLASH_ERROR_OPT, FLASH_COMPLETE, FLASH_TIMEOUT, FLASH_BAD_ADDRESS } FLASH_Status;